Project Description

ExamvueDR 1417c

Provide high sensitivity and resolution taking advantage of fine structured Csl/Tl screen.

Excellent Sensitivity & Resolution

  • Provide high sensitivity and resolution taking advantage of fine structured Csl/Tl screen
  •  Adopting reflection coating on Csl/Tl screen enables excellent sensitivity
  • Excellent Image Quality

    • Achieving low noise by noise canceling image processing circuit.
    • Low lag image by strengthen refresh function, suitable for during radiographic exposure.
    •  Attached driver soft can provide excellent clean raw image, adopting real-time off-set, gain and defect corrections.

    Excellent Reliability

    • Excellent reliability by using Csl/Tl screen direct vapor deposition method.
    •  Long product life achieved using unique water-proof method of Csl/Tl screen.
    • Structure simulation adopted improved endurance of this product from vibration/shocks during operation.
Application General Radiography
TFT TFT array + Photo Diode (a-Si)
Conversion Screen Csl:TI (direct vapor deposition) + reflective coating
Active area 14x 17 inch (35x 43cm)
Active Pixel Matrix 2,448 x 2,984( 7.3 million pixels)
Pixel Pitch 143um
A/D Conversion 16bits
Image Resolution 3.7LP/mm
Image output time  3 seconds for full image
Cycle Time ( min/Std) 6 second (min.)/1minutes (Std)

9 second (with image lag reduction)

MTF (2LP/mm)
(2.0 Lp/mm, 70 kVp, 1×1): 30 % Typ.
DQE 15 x 18 x 0.6 in  (384 x 460 x 15mm
Weight 6.6lbs (3kg)
Dimensions 15 x 18 x 0.6 in  (384 x 460 x 15mm
Certification  IEC60601-1,IEC60601-1-2
MDD93/42/EEC (CE marking)

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